International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 56

Dependability

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 5604 DELPUB1997-042008

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
1985-05-01 
ANW
1985-05-02 
1CD
1989-05-01 
CCDV
56(SEC.)/379/CDV  
1994-02-11 
ADIS
56/431/RVC  
1995-01-13 
DEC
1996-06-161996-03-31
RDIS
1996-06-171996-07-31
CDIS
56/532/FDIS  
1996-12-061996-10-31
APUB
56/574/RVD  
1997-03-141997-03-31
BPUB
1997-04-071997-04-30
PPUB
1997-05-161997-05-31
DELPUB
2008-08-13 

Project

IEC 61649 Ed. 1.0

Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data

 

Remark:

- see 56/828/DC, WG2 recommends revision of standard - issued 56/838/MCR

 

Associated Documents:

56/431/RVC

 
56/511/RM

 
56/828/DC

56/837/DC

56/838/MCR

56/1243/MCR