International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 05 | H. Matsuyama | DEL |
History
Stage | Document | Downloads | Decision Date | Target Date | ||||
|---|---|---|---|---|---|---|---|---|
| PNW |
| 2012-01-19 | ||||||
| DEL |
| 2012-07-26 | 2012-06-15 | |||||
25 kBProject
PNW 47-2119 Ed. 1.0
Copper Stress migration Test Method
Remark:
Project plan - CD: 2012-12, IS: 2014-12 Relationship of project activities with other international bodies - JEDEC