International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 4705H. MatsuyamaDEL  

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/2119/NP  
47/2119A/NP  
2012-01-19 
DEL
47/2137/RVN  
2012-07-262012-06-15

Project

PNW 47-2119 Ed. 1.0

Copper Stress migration Test Method

 

Remark:

Project plan - CD: 2012-12, IS: 2014-12 Relationship of project activities with other international bodies - JEDEC