International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 4702Jim LYNCHDEL  

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/1744/NP pdf file 71 kB
2004-01-16 
DEL
2004-03-192004-05-31

Project

PNW 47-1744 Ed. 1.0

Complete update of IEC 60749. Addition of test methods (together with proposed number): IEC 60749-20-1, IEC 60749-35, IEC 60749-37, IEC 60749-38, IEC 60749-39 - (this NP is CANCELLED)

 

Remark:

- Target 1CD: 04-10, IS: 06-10 - this NP is CANCELLED with 47/1755/INF

 

Associated Documents:

47/1755/INF