International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 47  DEL  

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/1411/NP  
1997-04-18 
DEL
47/1420/RVN  
1997-11-141997-09-15

Project

PNW 47-1411 Ed. 1.0

Modification of the sealing test of IEC 749

 

Remark: