International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 02 | DELPUB | 2005 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| CDPAS |
| 2000-01-21 | ||||
| APUB |
| 2000-04-10 | 2000-04-30 | |||
| BPUB | 2000-04-17 | 2000-05-30 | ||||
| PPUB | 2000-09-14 | 2000-06-15 | ||||
| DELPUB | 2005-01-20 | |||||
27 kBProject
IEC/PAS 62182 Ed. 1.0
Preconditioning of nonhermetic surface mount devices prior to reliability testing
Remark:
superseded by IEC 60749-30 ed.1 (2005)