International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 4702 WPUB  

History

Stage
Document
Downloads
Decision Date
Target Date
CDPAS
47/1450/PAS
2000-01-21 
APUB
47/1483/RVD pdf file 28 kB
2000-04-102000-04-30
BPUB
2000-04-172000-05-30
PPUB
2000-08-242000-06-15
WPUB
47/1627/MCR pdf file 12 kB
2002-07-012002-06-30

Project

IEC/PAS 62177 Ed. 1.0

Highly-accelerated temperature and humidity stress test (HAST)

 

Remark:

- Pub withdrawn 2002-06-30 - 47/1627/MCR - Replaced/superseded by IEC 60749-4 Ed.1

 

Associated Documents:

47/1627/MCR