International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 02 | PPUB | 2016 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| CDPAS |
| 2000-01-28 | ||||
| APUB |
| 2000-04-10 | 2000-04-30 | |||
| BPUB | 2000-04-17 | 2000-05-30 | ||||
| PPUB | 2000-08-22 | 2000-06-15 | ||||
28 kBProject
IEC/PAS 62162 Ed. 1.0
Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components
Remark:
- MRD extended with Toulouse mtg, 2007-11 - Intended to become IEC 60749-28