International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 02 | DELPUB | 2004-12 | 2007 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||||
|---|---|---|---|---|---|---|---|---|
| PNW |
| 2004-03-12 | ||||||
| ANW |
| 2004-10-08 | 2004-07-31 | |||||
| BPUB | 2004-10-08 | 2004-12-31 | ||||||
| PPUB | 2004-11-10 | 2004-12-31 | ||||||
| DELPUB | 2008-01-30 | |||||||
240 kBProject
IEC/PAS 62050 Ed. 1.0
Board level drop test method of components for handheld electronic products
Remark:
JESD22-B11 - intended to become future IEC 60749-37 - To be issued as PAS and also IEC PR in parallel - An IEC/PR is opened as IEC 60749-37