International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 47WG 5H. MatsuyamaCCDV2017-072022

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/2157/NP PDF file 968 kB
2012-12-21 
ANW
47/2176/RVN PDF file 7 kB
47/2176A/RVN Word file 142 kB
PDF file 98 kB
2013-06-262013-05-15
1CD
47/2191/CD PDF file 904 kB
2014-01-222014-04-30
ACDV
47/2201/CC Word file 213 kB
PDF file 130 kB
47/2201A/CC Word file 221 kB
PDF file 278 kB
2014-05-232014-05-31
CCDV
47/2296/CDV
PDF file 992 kB
2016-06-102016-01-31
ADIS
 2016-12-15
DEC
 2017-01-15

Project

IEC 62880-1 Ed. 1.0

Semiconductor devices - Stress Migration Test Standard - Part 1: Copper Stress Migration Test Standard

 

Remark:

Functions concerned - Safety, Environment, Quality assurance. Change of target date for CCDV to 2016-01 based on decision taken at TC 47 meeting in Minsk, Belarus on 201, 5-10-09 (47/2276/RM, SMB/5813/R). SMB/5690/DL - CCDV: 2015-12-31. Project plan - CDV: 2015-03, FDIS: 2016-01. Liaison - JEITA/EIA and JEITA

 

Associated Documents:

SMB/5690/DL

 
47/2276/RM

SMB/5813/R