International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 4705Nobuyuki WAKAIPPUB2010-102015

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/1892/NP pdf file 461 kB
2006-09-29 
ANW
47/1924/RVN pdf file 119 kB
47/1924A/RVN pdf file 132 kB
2007-08-312007-02-15
1CD
47/1946/CD pdf file 365 kB
2007-11-022007-12-31
ACDV
47/1998/CC pdf file 289 kB
2008-09-262008-03-31
CCDV
47/2001/CDV pdf file 392 kB
2008-10-172008-10-31
ADIS
47/2045/RVC doc file 135 kB
pdf file 260 kB
2010-02-122010-06-30
DEC
2010-05-142010-06-30
RDIS
2010-05-252010-05-31
CDIS
47/2063/FDIS

2010-06-182010-08-15
APUB
47/2077/RVD pdf file 206 kB
2010-09-062010-08-31
BPUB
2010-09-072010-09-15
PPUB
2010-09-292010-10-15

Project

IEC 62374-1 Ed. 1.0

Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

 

Remark:

- RDIS: 2010-06-30 PPUB: 2010-10-31 (see SMB/4204/DL) - Proposed target: FDIS: 2010-06 IS: 2010-10 - cc: TC 56, 91, 101 - Targets CDV: 2008-09 FDIS: 2009-09

 

Associated Documents:

SMB/4204/DL