International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | PT 62258 | James WOLBERT | PPUB | 2011-05 | 2015 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||||
|---|---|---|---|---|---|---|---|---|
| AMW |
| 2008-01-24 | ||||||
| 1CD |
| 2008-01-25 | 2008-01-31 | |||||
| CDM |
| 2008-09-26 | 2008-05-31 | |||||
| ACDV |
| 2008-12-19 | 2008-11-30 | |||||
| CCDV |
| 2009-08-21 | 2009-02-28 | |||||
| ADIS |
| 2010-05-21 | 2010-04-30 | |||||
| DEC | 2010-12-09 | 2010-10-31 | ||||||
| RDIS | 2010-12-21 | 2010-12-31 | ||||||
| CDIS |
| 2011-02-11 | 2011-03-15 | |||||
| APUB |
| 2011-04-21 | 2011-04-15 | |||||
| BPUB | 2011-04-22 | 2011-04-30 | ||||||
| PPUB | 2011-05-25 | 2011-05-31 | ||||||
89 kB
114 kBProject
IEC 62258-2 Ed. 2.0
Semiconductor die products - Part 2: Exchange data formats
Remark:
Targets - CDV: 2008-11 FDIS: 2009-11