International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 02 | James Lynch | DEL |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| PNW |
| 2000-05-19 | ||||
| ANW |
| 2000-08-11 | 2000-10-15 | |||
| AMW |
| 2002-04-12 | 2002-07-31 | |||
| DEL | 2002-07-01 | 2002-06-30 | ||||
27 kBProject
IEC 62205 Ed. 1.0
High Temperature Storage Life
Remark:
- Formerly IEC/PAS 47/1513/PAS - JESD22-A103-A-Test Method - Proj. will be DEL on 02-06-30 - Replaced by IEC 60749-6/Ed.1