International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 02 | DEL |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| PNW |
| 2000-02-18 | ||||
| ANW |
| 2000-05-05 | 2000-07-15 | |||
| AMW |
| 2001-11-09 | 2001-11-30 | |||
| DEL | 2002-01-31 | 2002-01-31 | ||||
27 kBProject
IEC 62191 Ed. 1.0
Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components
Remark:
- Formerly IEC/PAS (47/1476/PAS) IPC/JEDEC J-STD-035 - Project will be deleted 2002-01-31 - Replaced by IEC 60749/A2/ed2
Associated Documents:
47/1593/MCR