International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | DEL |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| PNW |
| 2000-01-21 | ||||
| ANW |
| 2000-04-21 | 2000-06-15 | |||
| AMW |
| 2002-04-12 | 2002-04-30 | |||
| DEL | 2002-07-01 | 2002-06-30 | ||||
27 kBProject
IEC 62186 Ed. 1.0
JESD22-B104-A - Test method B104-A - Mechanical shock
Remark:
- Formerly IEC/PAS 47/1459/PAS - JESD22-B104-A - proj. will be DEL on 02-06-30 - Replaced by IEC 60749-10/Ed.1