International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 02 | DEL |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| PNW |
| 2000-01-21 | ||||
| ANW |
| 2000-04-21 | 2000-06-15 | |||
| DEL | 2003-04-17 | 2002-04-30 | ||||
27 kBProject
IEC 62182 Ed. 1.0
Preconditioning of non-hermetic surface mount devices prior to reliability testing
Remark:
- Formerly IEC/PAS (47/1455/PAS) - JESD22-A113-B - This IEC 62182 has become IEC 60749-30 (47/1682/CD)