International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 02 | DEL |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| PNW |
| 2000-01-21 | ||||
| ANW |
| 2000-04-21 | 2000-06-15 | |||
| DEL | 2003-04-17 | 2002-04-30 | ||||
28 kBProject
IEC 62173 Ed. 1.0
EIA/JESD22-B102C - Solderability test method
Remark:
- Formerly IEC/PAS 47/1446/PAS - IEC 62173 has become IEC 60749-21 (47/1665/CDV)