International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 02 | DEL |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| PNW |
| 2000-01-21 | ||||
| ANW |
| 2000-04-21 | 2000-06-15 | |||
| PWI | 2003-02-12 | 2002-04-30 | ||||
| DEL | 2004-05-17 | |||||
28 kBProject
IEC 62165 Ed. 1.0
Guidelines for the measurement of thermal resistance of GaAs FETs
Remark:
- Formerly IEC/PAS (47/1465/PAS) JEP110 - Decision PWI taken by SMB 2003-02-12 - - This IEC PR has been withdrawn with the IEC/PAS on 04-05-15 by 47/1754/MCR
Associated Documents:
SMB/2486/DL
47/1754/MCR