International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 02 | DEL |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| PNW |
| 2000-01-21 | ||||
| ANW |
| 2000-04-21 | 2000-06-15 | |||
| AMW |
| 2003-01-10 | 2002-04-30 | |||
| DEL | 2003-03-15 | |||||
28 kBProject
IEC 62161 Ed. 1.0
Test method A101-B - Steady state, Temperature humidity bias life test
Remark:
- Formerly IEC/PAS (47/1461/PAS - EIA/JESD22-A101-B - Proj. DEL on 03-03-15 - Replaced by IEC 60749-5 Ed.1
Associated Documents:
47/1680/MCR