International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 4702Jim LYNCHPPUB 2016

History

Stage
Document
Downloads
Decision Date
Target Date
CDIS
47/1638/FDIS

2002-06-07 
APUB
47/1653/RVD pdf file 111 kB
2002-08-122002-08-31
BPUB
2002-08-132002-09-30
PPUB
2002-08-302002-10-31

Project

IEC 60749-8 Ed. 1.0

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

 

Remark:

- This project was circulated within 47/1638/FDIS for info only. The actual vote took place on 47/1574/FDIS - 47/1576/RVD