International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 4702M. EtiennePPUB 2016

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/1461/PAS
2000-01-21 
ANW
47/1494/RVD pdf file 28 kB
2000-04-212000-06-15
1CD
47/1524/CD pdf file 84 kB
2000-07-142000-07-31
ACDV
47/1577/CC pdf file 52 kB
2001-10-262000-11-30
CCDV
47/1600/CDV pdf file 39 kB
pdf file 47 kB
2002-01-112001-11-30
ADIS
47/1652/RVC pdf file 124 kB
2002-08-152002-08-15
DEC
2002-08-152002-08-31
RDIS
2002-08-192002-09-15
CDIS
47/1661/FDIS

2002-10-112002-11-30
APUB
47/1678/RVD pdf file 100 kB
2002-12-192003-02-15
BPUB
2002-12-202003-02-28
PPUB
2003-01-172003-02-28

Project

IEC 60749-5 Ed. 1.0

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

 

Remark:

- formerly IEC/PAS 62161 - Ref. EIA/JESD22-A101-B - CA decision Florence: ACDV target extended 01-12-31 - MRD revised as per decision in London, 2006-10

 

Associated Documents:

CA/2125/DL