International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 4702J. LynchCCDV2016-072021

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/2115/NP pdf file 546 kB
2011-12-14 
ANW
47/2139/RVN pdf file 20 kB
47/2139A/RVN pdf file 202 kB
2012-07-272012-04-30
1CD
47/2169/CD pdf file 474 kB
2013-05-242013-05-31
CDM
47/2182/CC pdf file 43 kB
47/2182A/CC doc file 341 kB
pdf file 439 kB
2013-09-05 
ACDV
47/2182/CC pdf file 43 kB
47/2182A/CC doc file 341 kB
pdf file 439 kB
2015-03-202015-04-30
CCDV
47/2231/CDV
pdf file 625 kB
pdf file 619 kB
2015-05-292015-06-30
ADIS
 2015-11-30
DEC
 2015-12-31

Project

IEC 60749-43 Ed. 1.0

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

 

Remark:

SMB/5436/DL - CCDV: 2015-04-30. Functions concerned - Safety and Quality assurance Project plan - CDV: 2014-05, FDIS: 2015-02 Liaison - JEDEC, JEITA Need for co-ordination: IEC TC91 WG3

 

Associated Documents:

SMB/5436/DL