International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 02 | James Lynch | PPUB | 2016 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| PNW |
| 2000-01-21 | ||||
| ANW |
| 2000-04-21 | 2000-06-15 | |||
| 1CD |
| 2002-05-17 | 2002-04-30 | |||
| ACDV |
| 2002-12-13 | 2002-09-30 | |||
| CCDV |
| 2002-12-13 | 2003-01-31 | |||
| ADIS |
| 2003-10-17 | 2003-08-15 | |||
| DEC | 2003-11-05 | 2003-12-15 | ||||
| RDIS | 2003-11-07 | 2003-11-30 | ||||
| CDIS |
| 2003-11-21 | 2004-02-15 | |||
| APUB |
| 2004-02-05 | 2004-05-15 | |||
| BPUB | 2004-02-06 | 2004-06-15 | ||||
| PPUB | 2004-03-09 | 2004-07-15 | ||||
28 kBProject
IEC 60749-33 Ed. 1.0
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
Remark:
supersedes IEC/PAS 62172 (2000)