International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 02 | James Lynch | PPUB | 2015 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||||
|---|---|---|---|---|---|---|---|---|
| PNW |
| 2000-01-21 | ||||||
| ANW |
| 2000-04-21 | 2000-06-15 | |||||
| 1CD |
| 2003-01-10 | ||||||
| CDM |
| 2003-09-19 | 2003-05-31 | |||||
| ACDV |
| 2003-10-31 | 2003-11-15 | |||||
| CCDV |
| 2003-11-21 | 2003-11-30 | |||||
| ADIS |
| 2004-07-30 | 2004-07-31 | |||||
| RDIS | 2004-08-11 | 2004-08-31 | ||||||
| DEC | 2004-08-11 | 2004-11-30 | ||||||
| CDIS |
| 2004-10-08 | 2004-11-15 | |||||
| APUB |
| 2004-12-13 | 2005-02-15 | |||||
| BPUB | 2004-12-14 | 2005-03-15 | ||||||
| PPUB | 2005-01-20 | 2005-04-15 | ||||||
27 kBProject
IEC 60749-30 Ed. 1.0
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Remark:
- formerly IEC/PAS 62182 - JESD22-A113-B - Previous IEC proj No. 62182 - MRD revised as per decision in London, 2006-10