International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 4702J. LynchNADIS2015-092017

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/2080/NP  
2010-11-12 
ANW
47/2109/RVN  
47/2109A/RVN  
2011-09-16 
1CD
47/2123/CD  
2012-03-022012-02-28
CDM
47/2149/CC  
47/2149A/CC  
2012-10-02 
ACDV
47/2149/CC  
47/2149A/CC  
2012-12-172012-11-30
CCDV
47/2155/CDV  
2013-03-062013-03-31
NADIS
47/2175/RVC  
2013-06-252013-09-15
CDVM
 2013-10-15
ACDV
 2015-04-30

Project

IEC 60749-28 Ed. 1.0

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic Discharge (ESD) Sensitivity Testing Direct contact charged device model (DC-CDM)

 

Remark:

SMB/5492/DL - CCDV: 2015-04-30. SMB/5347/DL - CCDV: 2014-11-30. Function concerned - Environment Project plan - CDV: 2013-02, FDIS: 2014-02 Relationship of project: This project may involve co-operation with JEDEC/EIA, ESDA and JEITA Liaison organizations: JEDEC/EIA, ESDA and JEITA Need for coordination within ISO or IEC: This project will be progressed with the full and active collaboration of TC101 WG6 Originally released as 60749-28 f1 Ed.1

 

Associated Documents:

SMB/5492/DL