International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 4702Jim LynchPPUB2011-022015

History

Stage
Document
Downloads
Decision Date
Target Date
AMW
47/2009/MCR pdf file 9 kB
47/2009A/MCR pdf file 217 kB
2009-01-09 
CCDV
47/2017/CDV pdf file 452 kB
pdf file 669 kB
2009-07-312009-06-30
APUB
47/2074/RVC doc file 101 kB
pdf file 207 kB
2010-09-032010-03-31
DEC
2010-12-032010-12-31
BPUB
2010-12-142010-12-31
PPUB
2011-01-272011-04-30

Project

IEC 60749-23 am1 Ed. 1.0

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

 

Remark: