International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 4702James LynchPPUB 2015

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/1474/PAS
2000-02-18 
ANW
47/1510/RVD pdf file 26 kB
2000-05-052000-07-15
1CD
47/1636/CD pdf file 127 kB
2002-05-172002-04-30
ACDV
47/1670/CC pdf file 78 kB
2002-12-132002-09-30
CCDV
47/1671/CDV pdf file 155 kB
2002-12-132003-01-31
DEC
2003-08-142003-12-15
ADIS
47/1716/RVC pdf file 115 kB
2003-08-152003-08-15
RDIS
2003-08-152003-08-31
CDIS
47/1735/FDIS

2003-11-142003-11-15
APUB
47/1745/RVD pdf file 75 kB
2004-01-232004-02-15
BPUB
2004-01-262004-03-15
PPUB
2004-02-232004-04-15

Project

IEC 60749-23 Ed. 1.0

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

 

Remark:

- Formerly IEC/PAS 62189 JESD22-A108-A - Previous PR No IEC 62189 - Also of interest to: 91 and 104 - MRD revised as per decision in London, 2006-10