International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 02 | James Lynch | PPUB | 2015 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| PNW |
| 2000-02-18 | ||||
| ANW |
| 2000-05-05 | 2000-07-15 | |||
| 1CD |
| 2002-05-17 | 2002-04-30 | |||
| ACDV |
| 2002-12-13 | 2002-09-30 | |||
| CCDV |
| 2002-12-13 | 2003-01-31 | |||
| DEC | 2003-08-14 | 2003-12-15 | ||||
| ADIS |
| 2003-08-15 | 2003-08-15 | |||
| RDIS | 2003-08-15 | 2003-08-31 | ||||
| CDIS |
| 2003-11-14 | 2003-11-15 | |||
| APUB |
| 2004-01-23 | 2004-02-15 | |||
| BPUB | 2004-01-26 | 2004-03-15 | ||||
| PPUB | 2004-02-23 | 2004-04-15 | ||||
26 kBProject
IEC 60749-23 Ed. 1.0
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Remark:
- Formerly IEC/PAS 62189 JESD22-A108-A - Previous PR No IEC 62189 - Also of interest to: 91 and 104 - MRD revised as per decision in London, 2006-10