International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 4702 DELPUB 2009

History

Stage
Document
Downloads
Decision Date
Target Date
BPUB
2003-07-18 
PPUB
2003-08-132003-08-31
DELPUB
2008-12-09 

Project

IEC 60749-20 fC1 Ed. 1.0

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat

 

Remark:

- Acc. to SMB OK decision on SMB/2530/R