International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 02 | M. Etienne | PPUB | 2016 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| PNW |
| 1998-02-27 | ||||
| ANW |
| 1998-06-19 | 1998-07-15 | |||
| 1CD |
| 2000-07-14 | 1999-12-31 | |||
| ACDV |
| 2001-10-26 | 2000-11-30 | |||
| CCDV |
| 2001-11-09 | 2001-11-30 | |||
| ADIS |
| 2002-07-12 | 2002-07-15 | |||
| DEC | 2002-09-19 | 2002-11-15 | ||||
| RDIS | 2002-09-23 | 2002-10-15 | ||||
| CDIS |
| 2002-11-22 | 2002-12-31 | |||
| APUB |
| 2003-01-28 | 2003-02-28 | |||
| BPUB | 2003-01-29 | 2003-03-31 | ||||
| PPUB | 2003-02-20 | 2003-04-30 | ||||
67 kBProject
IEC 60749-17 Ed. 1.0
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
Remark:
cc: TC 91, TC 104 - CA decision Florence: ACDV target extended 01-11-15
Associated Documents:
CA/2125/DL