International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 02 | Jim LYNCH | PPUB | 2016 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||||
|---|---|---|---|---|---|---|---|---|
| PNW |
| 1998-02-27 | ||||||
| ANW |
| 1998-06-19 | 1998-07-15 | |||||
| 1CD |
| 1999-07-16 | 1999-11-30 | |||||
| ACDV |
| 2000-07-14 | 1999-12-31 | |||||
| CCDV |
| 2000-07-21 | 2000-07-31 | |||||
| ADIS |
| 2001-02-23 | 2001-03-31 | |||||
| DEC | 2001-11-05 | 2001-07-31 | ||||||
| RDIS | 2001-11-06 | 2001-11-30 | ||||||
| CDIS |
| 2002-01-11 | 2002-02-15 | |||||
| APUB |
| 2002-03-18 | 2002-03-31 | |||||
| BPUB | 2002-03-19 | 2002-04-30 | ||||||
| PPUB | 2002-04-09 | 2002-05-31 | ||||||
93 kBProject
IEC 60749-10 Ed. 1.0
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
Remark:
- Formerly IEC/PAS 62186 (47/1459/PAS-47/1492/RVD) - Derived from Proj. No. 60749/F1/Ed.3 - cc: 104