International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | PPUB | 2016 |
History
Project
IEC 60749-1 fC1 Ed. 1.0
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Remark:
Acc. to SMB OK decision on SMB/2530/R