International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 02 | M. Etienne | PPUB | 2016 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||||
|---|---|---|---|---|---|---|---|---|
| PNW |
| 1998-02-27 | ||||||
| ANW |
| 1998-06-19 | 1998-07-15 | |||||
| 1CD |
| 2000-06-16 | 1999-11-30 | |||||
| ACDV |
| 2001-04-27 | 2000-10-30 | |||||
| CCDV |
| 2001-05-04 | 2001-05-31 | |||||
| ADIS |
| 2001-11-02 | 2002-01-15 | |||||
| DEC | 2002-03-12 | 2002-03-15 | ||||||
| RDIS | 2002-03-22 | 2002-04-15 | ||||||
| CDIS |
| 2002-05-07 | 2002-06-30 | |||||
| APUB |
| 2002-08-12 | 2002-08-31 | |||||
| BPUB | 2002-08-13 | 2002-09-30 | ||||||
| PPUB | 2002-08-30 | 2002-10-15 | ||||||
23 kBProject
IEC 60749-1 Ed. 1.0
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Remark:
- intended to become 60749-1 (umbrella publication) - Formerly proj. No 60749/F3/Ed.3 - Split after FDIS level as it contained also 60749-8, -20, -22, -31, -32