International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | DEL |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| PNW | 1989-08-01 | |||||
| ANW | 1991-06-14 | |||||
| 1CD |
| 1992-05-22 | ||||
| ACDV | 1992-12-11 | |||||
| DEL | 1994-10-28 | |||||
Project
IEC 60749 am4 f6 Ed. 1.0
Amendments to IEC 749 - Inclusion of optoelectronic semi-conductor devices - Inclusion of LCD devices - Endurance tests
Remark:
- Covered by 47C(Sec.)67.
Associated Documents:
47C/167/RM