International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 4701 DEL  

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
   
1991-10-18 
ANW
47(SEC.)/1263/RVN  
1992-02-15 
BWG
1992-11-01 
ACDV
1994-10-28 
DEL
1995-11-10 

Project

IEC 60749 am4 f4 Ed. 1.0

Amendment to IEC 749 - Clause 1: Substrate bending test for SMD-Semiconductors

 

Remark:

 

Associated Documents:

47/1387/RM

 
47/1393/RM

 
47/1406/RM