International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 01 | DEL |
History
Stage | Document | Downloads | Decision Date | Target Date | ||||
|---|---|---|---|---|---|---|---|---|
| PNW | 1986-02-01 | |||||||
| ANW | 1986-02-02 | |||||||
| CDIS | 1988-05-01 | |||||||
| 1CD |
| 1992-02-07 | ||||||
| BWG |
| 1992-02-08 | ||||||
| DREJ | 1994-10-28 | |||||||
| DEL | 1995-11-10 | |||||||
Project
IEC 60749 am4 f1 Ed. 1.0
Mechanical and climatic test methods - Test method: Internal moisture content
Remark:
Associated Documents:
47/1387/RM