International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 4702 WPUB 2010

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
1989-07-01 
ANW
1989-07-02 
1CD
1989-07-31 
CCDV
47(SEC.)/1316/CDV  
1993-01-29 
ADIS
47(SEC.)/1334/RVC  
1993-10-08 
DEC
1996-03-18 
RDIS
1996-03-191996-04-30
CDIS
47/1394/FDIS  
1996-03-22 
APUB
47/1402/RVD  
1996-06-101996-06-30
BPUB
1996-06-111996-07-31
PPUB
1996-10-281996-07-15
WPUB
47/1767/MCR pdf file 61 kB
2004-05-212004-07-31

Project

IEC 60749 Ed. 2.0

Semiconductor devices - Mechanical and climatic test methods

 

Remark:

- Supersedes Ed. 1 (1984), Amend. 1 (1991) and Amend 2 (1993) - Withdrawn by 47/1767/MCR on 04-07-30 and replaced by 60749-xx Parts acc. to annex of MCR

 

Associated Documents:

47/1387/RM

 
47/1393/RM

 
47/1767/MCR