International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |

Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 |   | WPUB |   |
History
Project
IEC 60147-2F Ed. 1.0
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods - Sixth supplement
Remark:
- 47/1379/RVS on 47/1362/SR --> withdrawn.

