International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 05 | J. Bisschop | DEL |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| PNW |
| 1999-07-16 | ||||
| ANW |
| 2000-08-18 | 1999-11-30 | |||
| PWI | 2002-10-28 | 2001-10-31 | ||||
| DEL | 2004-09-17 | |||||
82 kBProject
DEL 62228 Ed. 1.0
Hot carrier test on MOS transistors
Remark:
-This Proj. will later be included in 61189-5 - Put at PWI stage decision SMB Beijing 02-10-28 -JEDEC/EIA,TC 56 - Re-started with 47/1786/NP
Associated Documents:
SMB/2397/DL