International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 05 | J. Bisschop | DEL |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| PNW |
| 1999-07-16 | ||||
| ANW |
| 2000-08-18 | 1999-11-30 | |||
| PWI | 2002-10-28 | 2001-10-31 | ||||
| DEL | 2004-09-17 | |||||
105 kBProject
DEL 62227 Ed. 1.0
Electromigration test procedure
Remark:
- Put at PWI stage decision SMB Beijing 02-10-28 - Re-started with 47/1785/NP - JEDEC/EIA, TC 56
Associated Documents:
SMB/2397/DL