International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 04 | Prof. H. Dorey | DEL |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| PNW |
| 1997-02-14 | ||||
| ANW |
| 1997-06-30 | 1997-06-30 | |||
| PWI | 2000-02-29 | 1999-02-28 | ||||
| DEL | 2002-10-28 | |||||
184 kBProject
DEL 62047 Ed. 1.0
Measurement and measurement devices for microelectromechanical devices
Remark:
- Liaison IEEE TC 9, JISC. - Need coord. ISO/TC 3. - Deleted - decision at meeting held in Beijing 2002-10-28
Associated Documents:
47/1427/RM