International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 4704Prof. H. DoreyDEL  

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/1407/NP pdf file 184 kB
1997-02-14 
ANW
47/1418/RVN pdf file 127 kB
1997-06-301997-06-30
PWI
2000-02-291999-02-28
DEL
2002-10-28 

Project

DEL 62047 Ed. 1.0

Measurement and measurement devices for microelectromechanical devices

 

Remark:

- Liaison IEEE TC 9, JISC. - Need coord. ISO/TC 3. - Deleted - decision at meeting held in Beijing 2002-10-28

 

Associated Documents:

47/1427/RM