International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47F

Systèmes microélectromécaniques

 
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SC 47F Document de Travail depuis 2015-10-02

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Date de

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Date de

Fermeture

CENELEC

Votes /

Commentaires

Comit?s

Authoris?s

47F/260A/INF

[Report of comments on 47F/247/DC: Maintenance - call for comments/ proposals on publications coming up for review and a call for experts]

Titre français non disponible

2016-09-23
47F/248A/DA

[Revised draft agenda for the meeting to be held in Frankfurt, Germany on 2016-10-05 (14:00 h to 17:30 h)]

Titre français non disponible

2016-09-09
47F/262/RVN

[Result of voting on 47F/246/NP: Future IEC 62047-31: Semiconductor devices - Micro-electromechanical devices - Part 31: Four-point bending test method for interfacial adhesion energy of layered MEMS materials ]

Titre français non disponible

2016-09-09 ?
47F/264/INF

[Review of Active Participation of P-members in the Work of SC 47F]

Titre français non disponible

2016-09-09
47F/265/PW

[Programme of Work of SC 47F as recorded by the IEC Central Office in its database]

Titre français non disponible

2016-09-09
47F/259/RVC

[Result of voting on 47F/230A/CDV: IEC 62047-27 Ed.1: Semiconductor devices - Micro-electromechanical devices - Part 27: Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT)]

Titre français non disponible

2016-09-02 yes
47F/260/INF

[This document has been replaced by 47F/260A/INF]

Titre français non disponible

2016-09-02
47F/261/RVC

[Result of voting on 47F/242/CDV: IEC 62047-28 Ed.1: Semiconductor devices - Micro-electromechanical devices - Part 28: Performance testing method of vibration-driven MEMS electret energy harvesting devices]

Titre français non disponible

2016-09-02 yes
47F/255/NP

[Future IEC 62047-32: Semiconductor devices - Micro-electromechanical devices - Part 32: Test method for the nonliear vibration of the MEMS resonators]

Titre français non disponible

2016-08-26 2016-11-18 ?
47F/256/NP

[Future IEC 62047-33: Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device ]

Titre français non disponible

2016-08-26 2016-11-18 ?
47F/257/NP

[Future IEC 62047-34: Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for wafer level MEMS piezoresistive pressure-sensitive device]

Titre français non disponible

2016-08-26 2016-11-18 ?
47F/258/CC

[Compilation of comments on 47F/243/CD: IEC 62047-29 Ed.1: Semiconductor devices - Micro-electromechanical devices - Part 29: Electromechanical relaxation test method for freestanding conductive thin-films under room temperature]

Titre français non disponible

2016-08-26 no
47F/252/RVD

Rapport de vote sur le 47F/249

2016-08-12 yes
47F/253/CC

[Compilation of comments on 47F/241/CD: IEC 62047-30 Ed.1: Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film]

Titre français non disponible

2016-08-12 no
47F/251/RQ

[Result of 47F/245/Q: Questionnaire on the appointment of a new convenor of WG 1 (Terminologies and generic specification for micro-electromechanical systems) of IEC SC 47F]

Titre français non disponible

2016-07-29
47F/250/RQ

[Nomination for Chair of SC 47F]

Titre français non disponible

2016-07-01
47F/249/FDIS

IEC 62047-25 Ed.1: Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 25: Technologie de fabrication de MEMS à base de silicium - Méthode de mesure de la résistance à la traction-compression et au cisaillement d'une micro zone de brasure

2016-06-24 2016-08-05 yes Voting Result
47F/248/DA

[Draft agenda for the meeting to be held in Frankfurt, Germany on 2016-10-05 (14:00 h to 17:30 h)]

Titre français non disponible

2016-06-10
47F/245/Q

[Questionnaire on the appointment of a new convenor of WG 1 (Terminologies and generic specification for micro-electromechanical systems) of IEC SC 47F]

Titre français non disponible

2016-06-03 2016-07-15 Report of Comments
47F/246/NP

[Future IEC 62047-31: Semiconductor devices - Micro-electromechanical devices - Part 31: Four-point bending test method for interfacial adhesion energy of layered MEMS materials]

Titre français non disponible

2016-06-03 2016-08-26 ? Voting Result
47F/247/DC

[Maintenance - call for comments/ proposals on publications coming up for review and a call for experts]

Titre français non disponible

2016-06-03 2016-08-26 Report of Comments
47F/244/Q

[Nomination for Chair of SC 47F]

Titre français non disponible

2016-05-13 2016-06-24 Report of Comments
47F/242/CDV

[IEC 62047-28 Ed.1: Semiconductor devices - Micro-electromechanical devices - Part 28: Performance testing method of vibration-driven MEMS electret energy harvesting devices]

Titre français non disponible

2016-04-29 2016-07-22 yes Voting Result
47F/234A/RVN

[Result of voting on 47F/224/NP: Future IEC 62047-29: Semiconductor devices - Micro-electromechanical devices - Part 29: Electromechanical relaxation test method for freestanding MEMS materials under room temperature ]

Titre français non disponible

2016-03-25 no
47F/243/CD

[IEC 62047-29 Ed.1: Semiconductor devices - Micro-electromechanical devices - Part 29: Electromechanical relaxation test method for freestanding conductive thin-films under room temperature]

Titre français non disponible

2016-03-25 2016-05-20 no Report of Comments
47F/241/CD

[IEC 62047-30 Ed.1: Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film]

Titre français non disponible

2016-02-12 2016-05-06 no Report of Comments
47F/240/AC

[Call for nominations for Chair of SC 47F: Micro-electromechanical systems]

Titre français non disponible

2016-02-05 2016-05-06 Report of Comments
47F/230A/CDV

IEC 62047-27 Ed.1: Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 27: Essai de résistance du collage de structures collées par du verre fritté par des essais à microchevron

2016-01-15 2016-02-19 yes Voting Result
47F/239/RVD

Rapport de vote sur le 47F/233

2015-12-18 yes
47F/235A/RVN

[Revised result of voting on 47F/225/NP: Future IEC 62047-30: Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film and reporting schema]

Titre français non disponible

2015-12-11 no
47F/238/RVD

Rapport de vote sur le 47F/232

2015-12-04 yes
47F/237/RM

[Unconfirmed minutes of SC 47F plenary meeting held at Victoria Olimp in Minsk, Belarus on October 07, 2015]

Titre français non disponible

2015-11-26
47F/236/RVC

[Result of voting on 47F/219/CDV: IEC 62047-25 Ed.1: Semiconductor devices - Micro-electromechanical devices - Part 25: Silicon-based MEMS fabrication technology - Measurement method of pull-press and shearing strength of micro bonding area]

Titre français non disponible

2015-11-20 yes
47F/230/CDV

[This document has been replaced by 47F/230A/CDV]

Titre français non disponible

2015-11-13 yes
47F/234/RVN

[This document has been replaced by 47F/234A/RVN]

Titre français non disponible

2015-11-06 no
47F/235/RVN

[Result of voting on 47F/225/NP: Future IEC 62047-30: Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film and reporting schema]

Titre français non disponible

2015-11-06 no
47F/233/FDIS

IEC 62047-26 Ed.1: Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 26: Description et méthodes de mesure pour structures de microtranchées et de microaiguille

2015-10-09 2015-12-11 yes Voting Result