International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 86

Fibre optics

 
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TC 86 Working Documents since 2014-01-29

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86/478/RM

Unconfirmed Minutes of the meeting held in Tokyo, Japan, on November 12, 2014
2015-01-09
86/476/CC

Compilation of comments on 86/468/CD: IEC 62129-1/Ed1: Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
2014-11-21yes
86/475/CD

IEC 62496-2/Ed1: Optical circuit boards - Basic test and measurement procedures - Part 2: General guidance for definition of measurement conditions for optical characteristics of optical circuit boards
2014-10-172015-01-23?Report of Comments
TC 91
86/471A/DA

Revised draft agenda for the meeting to be held in Tokyo, Japan, from 2014-11-12 (starting time: 09:00) to 2014-11-12 (approximate finishing time: 18:00)
2014-10-10
86/474/PW

Programme of work of the Committee, as recorded by the IEC Central Office in its database
2014-10-10
86/473/RQ

Result of Questionnaire on 86/469/Q: Extension of the term of office of the Chairman of SC: 86B
2014-08-15
86/470/AC

Chairmanship of TC 86
2014-08-012014-11-07Report of Comments
86/471/DA

Draft agenda for the meeting to be held in Tokyo, Japan, from 2014-11-12 (starting time: 09:00) to 2014-11-12 (approximate finishing time: 18:00)
2014-08-01
86/472/RVN

Result of voting on 86/467/NP: Future IEC 62496-2/Ed1: Optical circuit boards - Basic test and measurement procedures - Part 2: General guidance for definition of measurement conditions for optical characteristics of optical circuit boards
2014-08-01?
86/469/Q

Extension of the term of office of the Chairman of SC 86B: Fibre optic interconnecting devices and passive components
2014-06-272014-08-08Report of Comments
86/468/CD

IEC 62129-1 Ed.1.0: Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
2014-06-202014-09-26yesReport of Comments
86/467/NP

Future IEC 62496-2/Ed1: Optical circuit boards - Basic test and measurement procedures - Part 2: General guidance for definition of measurement conditions for optical characteristics of optical circuit boards
2014-02-142014-05-16?Voting Result
TC 91