International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Dispositifs à semiconducteurs

 
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TC 47 Document de Travail depuis 2015-05-01

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47/2301/NP

[Future IEC 62779-4 Ed.1: Semiconductor devices - Semiconductor interface for human body communication- Part 4: Semiconductor interface for capsule endoscopy using human body communication ]

Titre français non disponible
2016-04-292016-07-22
47/2299/RR

[IEC 60749-9 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking]

Titre français non disponible
2016-04-22?
47/2287/CDV

[IEC 60749-4 Ed.2: Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)]

Titre français non disponible
2016-04-152016-07-08yes
TC 91
TC 104
47/2201A/CC

[Revised compilation of comments on 47/2191/CD: IEC 62880-1 Ed.1: Semiconductor devices - Wafer Level Reliability for Semiconductor Devices - Part 1: Copper Stress Migration Test Method]

Titre français non disponible
2016-04-08yes
47/2293/NP

[Future IEC XXXXX-1 Ed.1: Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 1: Classification of defects]

Titre français non disponible
2016-04-082016-07-01?
47/2294/RR

[Review report on IEC 60749-6 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature]

Titre français non disponible
2016-04-08?
47/2295/RR

[Review report on IEC 60749-3 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination]

Titre français non disponible
2016-04-08?
47/2281/CDV

[IEC 60749-28 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level]

Titre français non disponible
2016-04-012016-06-24yes
TC 91
TC 101
TC 104
47/2291/NP

[Semiconductor devices - Reliability of automotive semiconductors - Part 1: Estimating aging level of automotive semiconductors]

Titre français non disponible
2016-03-252016-06-17?
TC 69
47/2292/RVD

Rapport de vote sur le 47/2282
2016-03-25yes
47/2290/RQ

[Result of Questionnaire on 47/2279/Q: Nomination for Chair of SC 47E: Discrete semiconductor devices]

Titre français non disponible
2016-03-18
47/2288/RR

[Review report on IEC/PAS 62162 Ed.1: Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components]

Titre français non disponible
2016-03-04
47/2289/RR

[Review report on IEC/PAS 62435 Ed.1: Electronic components Long-duration storage of electronic components Guidance for implementations]

Titre français non disponible
2016-03-04
47/2175A/RVC

[Revised compilation of comments on 47/2155/CDV: IEC 60749-28 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic Discharge (ESD) Sensitivity Testing Direct contact charged device model (DC-CDM) ]

Titre français non disponible
2016-02-12yes
47/2284/NP

[Future IEC 62951-7 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor]

Titre français non disponible
2016-02-122016-05-06?
47/2285/RVC

[Result of voting on 47/2226/CDV: IEC 60749-44 Ed. 1.0: Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices ]

Titre français non disponible
2016-02-12yes
47/2286/RR

[Review report on IEC 60749-4 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp Heat, steady state, highly accelerated stress test (HAST)]

Titre français non disponible
2016-02-12yes
47/2282/FDIS

IEC 62779-3 Ed.1: Dispositifs à semiconducteurs - Interface à semiconducteurs pour les communications via le corps humain - Partie 3: Type fonctionnel et ses conditions d'utilisation
2016-02-052016-03-18yesVoting Result
47/2283/Q

[Nomination of co-convenor in TC 47/WG7: Semiconductor devices for energy conversion and transfer]

Titre français non disponible
2016-02-052016-03-18Report of Comments
47/2277/RVD

Rapport de vote sur le 47/2267
2016-01-29yes
47/2278/RVD

Rapport de vote sur le 47/2268
2016-01-29yes
47/2279/Q

[Nomination for Chair of SC 47E: Discrete semiconductor devices]

Titre français non disponible
2016-01-292016-03-11Report of Comments
47/2280/RVC

[This document has been replaced by 47/2175A/RVC]

Titre français non disponible
2016-01-29
47/2272/CD

[IEC 62969-1 Ed.1: Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors]

Titre français non disponible
2016-01-152016-03-11?Report of Comments
47/2273/CD

[IEC 62969-2 Ed.1: Semiconductor devices - Semiconductor interface for automotive vehicles - Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors]

Titre français non disponible
2016-01-152016-03-11?Report of Comments
47/2274/CD

[IEC 62969-3 Ed.1: Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors]

Titre français non disponible
2016-01-152016-03-11?Report of Comments
47/2275/CD

[IEC 62969-4 Ed.1: Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors ]

Titre français non disponible
2016-01-152016-03-11?Report of Comments
47/2276/RM

[Unconfirmed Minutes of TC 47 Plenary meeting held in Minsk, Belarus on October 09, 2015]

Titre français non disponible
2016-01-15
47/2256/CDV

IEC 62951-1 Ed.1: Dispositifs à semiconducteurs - Dispositifs à semiconducteurs souples et extensibles - Partie 1: Méthode d'essai de courbure de couches minces conductrices sur des substrats souples
2015-12-112016-03-11yesVoting Result
TC 113
TC 119
47/2269/RVC

[Result of voting on 47/2214/CDV: IEC 62830-1 Ed.1: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting]

Titre français non disponible
2015-12-04yes
47/2270/RVC

[Result of voting on 47/2229/CDV: IEC 62830-2 Ed.1: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting]

Titre français non disponible
2015-12-04yes
47/2271/RVC

[Result of voting on 47/2232/CDV: IEC 62830-3 Ed.1: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 3: Vibration based electromagnetic energy harvesting]

Titre français non disponible
2015-12-04yes
47/2251/CDV

IEC 62435-1 Ed.1: Composants électroniques - Stockage de longue durée des dispositifs électroniques à semiconducteurs - Partie 1: Généralités
2015-11-202016-02-26yesVoting Result
47/2252/CDV

IEC 62435-2 Ed.1: Composants électroniques - Stockage de longue durée des dispositifs électroniques à semiconducteurs - Partie 2 - Mécanismes de détérioration
2015-11-202016-02-26yesVoting Result
47/2253/CDV

IEC 62435-5 Ed.1: Composants électroniques - Stockage de longue durée des dispositifs électroniques à semiconducteurs - Partie 5 - Dispositifs de puces et plaquettes
2015-11-202016-02-26yesVoting Result
47/2267/FDIS

IEC 62779-1 Ed.1: Dispositifs à semiconducteurs - Interface à semiconducteurs pour les communications via le corps humain - Partie 1: Exigences générales
2015-11-202016-01-22yesVoting Result
47/2268/FDIS

IEC 62779-2 Ed.1: Dispositifs à semiconducteurs - Interface à semiconducteurs pour les communications via le corps humain - Partie 2: Caractérisation des performances d'interfaçage
2015-11-202016-01-22yesVoting Result
47/2260/RVN

[Result of voting on 47/2234/NP: Future IEC 62830-5 Ed.1: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 5: Test method for measuring generated power from flexible thermoelectric devices]

Titre français non disponible
2015-11-06?
47/2261/RVN

[Result of voting on 47/2235/NP: Future IEC 62951-2 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Acceleration test for electron mobility, sub-threshold swing, and threshold voltage of flexible devices]

Titre français non disponible
2015-11-06?
47/2262/RVN

[Result of voting on 47/2236/NP: Future IEC 62951-3 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics (?, SS, Vth) on flexible substrates under bulging]

Titre français non disponible
2015-11-06?
47/2263/RVN

[Result of voting on 47/2237/NP: Future IEC 62951-4 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for films and substrates for flexible semiconductor devices]

Titre français non disponible
2015-11-06?
47/2264/RVN

[Result of voting on 47/2238/NP: Future IEC 62951-5 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials and devices ]

Titre français non disponible
2015-11-06?
47/2265/RVN

[Result of voting on 47/2239/NP: Future IEC 62951-6 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films]

Titre français non disponible
2015-11-06?
47/2266/RVN

[Result of voting on 47/2240/NP: Future IEC 62830-4 Ed.1: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 4: Test and evaluation methods for flexible piezoelectric energy harvesting devices]

Titre français non disponible
2015-11-06?
47/2259/RVN

[Result of voting on 47/2243/NP: Future IEC 62969-5 Ed.1: Semiconductor devices - Semiconductor interfaces for automotive vehicles - Part 5: Test/diagnosis method via vehicular network for automotive semiconductors]

Titre français non disponible
2015-10-30?
47/2257/RVN

[Result of voting on 47/2225/NP: Future IEC 60749-41 Ed.1: Semiconductor devices - mechanical and climatic test methods - Part 41: Reliability testing methods of non-volatile memory devices]

Titre français non disponible
2015-10-09?
47/2258/RQ

[Result of Questionnaire on 47/2247A/Q: Nomination of a Chair for SC 47A: Integrated circuits]

Titre français non disponible
2015-10-09
47/2255/CC

[Compilation of comments on 47/2242A/CD: IEC 62951-1 Ed.1 : Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates]

Titre français non disponible
2015-10-02yes
47/2244A/DA

[Revised draft agenda for the TC 47 meeting to be held in Minsk, Belarus on 09 October 2015 (09.00h - 12.00h)]

Titre français non disponible
2015-09-11
47/2248/CC

[Compilation of comments on 47/2172/CD: IEC 62435-1 Ed.1: Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General]

Titre français non disponible
2015-09-11yes
47/2249/CC

[Compilation of comments on 47/2173/CD: IEC 62435-2 Ed.1: Electronic components - Long-term storage of electronic semiconductor devices - Part 2 - Deterioration Mechanisms ]

Titre français non disponible
2015-09-11yes
47/2250/CC

[Compilation of comments on 47/2174/CD: IEC 62435-5 Ed.1: Electronic components - Long-term storage of electronic semiconductor devices - Part 5 - Die & Wafer Devices]

Titre français non disponible
2015-09-11yes
47/2254/PW

[Programme of Work of TC 47 as recorded by the IEC Central Office in its database]

Titre français non disponible
2015-09-11
47/2247A/Q

[Nomination of a Chair for SC 47A: Integrated circuits]

Titre français non disponible
2015-08-282015-10-02Report of Comments
47/2247/Q

[This document has been replaced by 47/2247A/Q]

Titre français non disponible
2015-08-21
47/2246/RVC

[Result of voting on 47/2227/CDV: IEC 62779-3 Ed.1: Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions]

Titre français non disponible
2015-08-14yes
47/2245/DC

[Review and Maintenance - call for comments/ proposals on publications coming up for review and a call for experts]

Titre français non disponible
2015-08-072015-09-18Report of Comments
47/2244/DA

[Draft agenda for the TC 47 meeting to be held in Minsk, Belarus on 09 October 2015 (09.00h - 12.00h)]

Titre français non disponible
2015-07-17
47/2217A/RVC

[Result of voting on 47/2196/CDV: IEC 62779-2 Ed.1: Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances]

Titre français non disponible
2015-07-10yes
47/2215A/RVC

[Result of voting on 47/2195/CDV: IEC 62779-1 Ed.1: Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements]

Titre français non disponible
2015-07-03yes
47/2241A/CC

[Compilation of comments on 47/2224/CD: IEC 62951-1 Ed.1 : Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates]

Titre français non disponible
2015-07-03yes
47/2242A/CD

[IEC 62951-1 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates]

Titre français non disponible
2015-07-032015-08-07yes
TC 113
TC 119
47/2243/NP

[Future IEC 62969-5 Ed.1: Semiconductor devices - Semiconductor interfaces for automotive vehicles - Part 5: Test/diagnosis method via vehicular network for automotive semiconductors]

Titre français non disponible
2015-06-122015-09-18?Voting Result
TC 69
47/2232/CDV

IEC 62830-3 Ed.1: Dispositifs à semiconducteurs - Dispositifs à semiconducteurs pour récupération et génération d'énergie - Partie 3: Récupération d'énergie électromagnétique basée sur des vibrations
2015-06-052015-09-11yesVoting Result
47/2241/CC

[This document has been replaced by 47/2241A/CC]

Titre français non disponible
2015-06-05yes
47/2242/CD

[This document has been replaced by 47/2242A/CD]

Titre français non disponible
2015-06-05yes
TC 113
TC 119
47/2231/CDV

IEC 60749-43 Ed.1: Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 43: Directives concernant les plans de qualification de la fiabilité des CI
2015-05-292015-09-04yesVoting Result
TC 91
TC 104
47/2240/NP

[Future IEC 62830-4 Ed.1: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 4: Test and evaluation methods for flexible piezoelectric energy harvesting devices]

Titre français non disponible
2015-05-152015-08-21?Voting Result
47/2233/RQ

[Result of Questionnaire 47/2230/Q: Change of convenor in TC 47/WG 3 (Electronic Components - Long duration storage of electronic components guide for implementation) ]

Titre français non disponible
2015-05-08
47/2234/NP

[Future IEC 62830-5 Ed.1: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 5: Test method for measuring generated power from flexible thermoelectric devices]

Titre français non disponible
2015-05-082015-08-14?Voting Result
TC 119
47/2235/NP

[Future IEC 62951-2 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Acceleration test for electron mobility, sub-threshold swing, and threshold voltage of flexible devices]

Titre français non disponible
2015-05-082015-08-14?Voting Result
TC 119
47/2236/NP

[Future IEC 62951-3 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics (?, SS, Vth) on flexible substrates under bulging]

Titre français non disponible
2015-05-082015-08-14?Voting Result
TC 119
47/2237/NP

[Future IEC 62951-4 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for films and substrates for flexible semiconductor devices]

Titre français non disponible
2015-05-082015-08-14?Voting Result
TC 119
47/2238/NP

[Future IEC 62951-5 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials and devices]

Titre français non disponible
2015-05-082015-08-14?Voting Result
TC 119
47/2239/NP

[Future IEC 62951-6 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films]

Titre français non disponible
2015-05-082015-08-14?Voting Result
TC 119