International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 
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TC 47 Working Documents since 2015-02-09

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47/2282/FDIS

IEC 62779-3 Ed.1: Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
2016-02-052016-03-18yes
47/2283/Q

Nomination of co-convenor in TC 47/WG7: Semiconductor devices for energy conversion and transfer
2016-02-052016-03-18
47/2277/RVD

Report of Voting on 47/2267/FDIS: IEC 62779-1 Ed.1: Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
2016-01-29yes
47/2278/RVD

Report of Voting on 47/2268/FDIS: IEC 62779-2 Ed.1: Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
2016-01-29yes
47/2279/Q

Nomination for Chair of SC 47E: Discrete semiconductor devices
2016-01-292016-03-11
47/2280/RVC

Result of voting on 47/2155/CDV: IEC 60749-28 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic Discharge (ESD) Sensitivity Testing Direct contact charged device model (DC-CDM)
2016-01-29yes
47/2272/CD

IEC 62969-1 Ed.1: Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors
2016-01-152016-03-11?
47/2273/CD

IEC 62969-2 Ed.1: Semiconductor devices - Semiconductor interface for automotive vehicles - Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors
2016-01-152016-03-11?
47/2274/CD

IEC 62969-3 Ed.1: Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors
2016-01-152016-03-11?
47/2275/CD

IEC 62969-4 Ed.1: Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors
2016-01-152016-03-11?
47/2276/RM

Unconfirmed Minutes of TC 47 Plenary meeting held in Minsk, Belarus on October 09, 2015
2016-01-15
47/2256/CDV

IEC 62951-1 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates
2015-12-112016-03-11yes
TC 113
TC 119
47/2269/RVC

Result of voting on 47/2214/CDV: IEC 62830-1 Ed.1: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting
2015-12-04yes
47/2270/RVC

Result of voting on 47/2229/CDV: IEC 62830-2 Ed.1: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting
2015-12-04yes
47/2271/RVC

Result of voting on 47/2232/CDV: IEC 62830-3 Ed.1: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 3: Vibration based electromagnetic energy harvesting
2015-12-04yes
47/2251/CDV

IEC 62435-1 Ed.1: Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General
2015-11-202016-02-26yes
47/2252/CDV

IEC 62435-2 Ed.1: Electronic components - Long-term storage of electronic semiconductor devices - Part 2 - Deterioration Mechanisms
2015-11-202016-02-26yes
47/2253/CDV

IEC 62435-5 Ed.1: Electronic components - Long-term storage of electronic semiconductor devices - Part 5 - Die & Wafer Devices
2015-11-202016-02-26yes
47/2267/FDIS

IEC 62779-1 Ed.1: Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
2015-11-202016-01-22yesVoting Result
47/2268/FDIS

IEC 62779-2 Ed.1: Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
2015-11-202016-01-22yesVoting Result
47/2260/RVN

Result of voting on 47/2234/NP: Future IEC 62830-5 Ed.1: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 5: Test method for measuring generated power from flexible thermoelectric devices
2015-11-06?
47/2261/RVN

Result of voting on 47/2235/NP: Future IEC 62951-2 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Acceleration test for electron mobility, sub-threshold swing, and threshold voltage of flexible devices
2015-11-06?
47/2262/RVN

Result of voting on 47/2236/NP: Future IEC 62951-3 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics (?, SS, Vth) on flexible substrates under bulging
2015-11-06?
47/2263/RVN

Result of voting on 47/2237/NP: Future IEC 62951-4 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for films and substrates for flexible semiconductor devices
2015-11-06?
47/2264/RVN

Result of voting on 47/2238/NP: Future IEC 62951-5 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials and devices
2015-11-06?
47/2265/RVN

Result of voting on 47/2239/NP: Future IEC 62951-6 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
2015-11-06?
47/2266/RVN

Result of voting on 47/2240/NP: Future IEC 62830-4 Ed.1: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 4: Test and evaluation methods for flexible piezoelectric energy harvesting devices
2015-11-06?
47/2259/RVN

Result of voting on 47/2243/NP: Future IEC 62969-5 Ed.1: Semiconductor devices - Semiconductor interfaces for automotive vehicles - Part 5: Test/diagnosis method via vehicular network for automotive semiconductors
2015-10-30?
47/2257/RVN

Result of voting on 47/2225/NP: Future IEC 60749-41 Ed.1: Semiconductor devices - mechanical and climatic test methods - Part 41: Reliability testing methods of non-volatile memory devices
2015-10-09?
47/2258/RQ

Result of Questionnaire on 47/2247A/Q: Nomination of a Chair for SC 47A: Integrated circuits
2015-10-09
47/2255/CC

Compilation of comments on 47/2242A/CD: IEC 62951-1 Ed.1 : Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates
2015-10-02yes
47/2244A/DA

Revised draft agenda for the TC 47 meeting to be held in Minsk, Belarus on 09 October 2015 (09.00h - 12.00h)
2015-09-11
47/2248/CC

Compilation of comments on 47/2172/CD: IEC 62435-1 Ed.1: Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General
2015-09-11yes
47/2249/CC

Compilation of comments on 47/2173/CD: IEC 62435-2 Ed.1: Electronic components - Long-term storage of electronic semiconductor devices - Part 2 - Deterioration Mechanisms
2015-09-11yes
47/2250/CC

Compilation of comments on 47/2174/CD: IEC 62435-5 Ed.1: Electronic components - Long-term storage of electronic semiconductor devices - Part 5 - Die & Wafer Devices
2015-09-11yes
47/2254/PW

Programme of Work of TC 47 as recorded by the IEC Central Office in its database
2015-09-11
47/2247A/Q

Nomination of a Chair for SC 47A: Integrated circuits
2015-08-282015-10-02Report of Comments
47/2247/Q

This document has been replaced by 47/2247A/Q
2015-08-21
47/2246/RVC

Result of voting on 47/2227/CDV: IEC 62779-3 Ed.1: Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
2015-08-14yes
47/2245/DC

Review and Maintenance - call for comments/ proposals on publications coming up for review and a call for experts
2015-08-072015-09-18Report of Comments
47/2244/DA

Draft agenda for the TC 47 meeting to be held in Minsk, Belarus on 09 October 2015 (09.00h - 12.00h)
2015-07-17
47/2217A/RVC

Result of voting on 47/2196/CDV: IEC 62779-2 Ed.1: Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
2015-07-10yes
47/2215A/RVC

Result of voting on 47/2195/CDV: IEC 62779-1 Ed.1: Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
2015-07-03yes
47/2241A/CC

Compilation of comments on 47/2224/CD: IEC 62951-1 Ed.1 : Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates
2015-07-03yes
47/2242A/CD

IEC 62951-1 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates
2015-07-032015-08-07yes
TC 113
TC 119
47/2243/NP

Future IEC 62969-5 Ed.1: Semiconductor devices - Semiconductor interfaces for automotive vehicles - Part 5: Test/diagnosis method via vehicular network for automotive semiconductors
2015-06-122015-09-18?Voting Result
TC 69
47/2232/CDV

IEC 62830-3 Ed.1: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 3: Vibration based electromagnetic energy harvesting
2015-06-052015-09-11yesVoting Result
47/2241/CC

This document has been replaced by 47/2241A/CC
2015-06-05yes
47/2242/CD

This document has been replaced by 47/2242A/CD
2015-06-05yes
TC 113
TC 119
47/2231/CDV

IEC 60749-43 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
2015-05-292015-09-04yesVoting Result
TC 91
TC 104
47/2240/NP

Future IEC 62830-4 Ed.1: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 4: Test and evaluation methods for flexible piezoelectric energy harvesting devices
2015-05-152015-08-21?Voting Result
47/2233/RQ

Result of Questionnaire 47/2230/Q: Change of convenor in TC 47/WG 3 (Electronic Components - Long duration storage of electronic components guide for implementation)
2015-05-08
47/2234/NP

Future IEC 62830-5 Ed.1: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 5: Test method for measuring generated power from flexible thermoelectric devices
2015-05-082015-08-14?Voting Result
TC 119
47/2235/NP

Future IEC 62951-2 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Acceleration test for electron mobility, sub-threshold swing, and threshold voltage of flexible devices
2015-05-082015-08-14?Voting Result
TC 119
47/2236/NP

Future IEC 62951-3 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics (?, SS, Vth) on flexible substrates under bulging
2015-05-082015-08-14?Voting Result
TC 119
47/2237/NP

Future IEC 62951-4 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for films and substrates for flexible semiconductor devices
2015-05-082015-08-14?Voting Result
TC 119
47/2238/NP

Future IEC 62951-5 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials and devices
2015-05-082015-08-14?Voting Result
TC 119
47/2239/NP

Future IEC 62951-6 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
2015-05-082015-08-14?Voting Result
TC 119
47/2229/CDV

IEC 62830-2 Ed.1: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting
2015-04-242015-07-24yesVoting Result
47/2226/CDV

IEC 60749-44 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
2015-04-172015-07-17yesVoting Result
TC 104
TC 107
47/2227/CDV

IEC 62779-3 Ed.1: Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
2015-04-172015-07-17yesVoting Result
47/2182A/CC

Compilation of comments on 47/2169/CD: IEC 60749-43 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plan
2015-03-20yes
47/2230/Q

Change of convenor in TC 47/WG 3: Electronic Components - Long duration storage of electronic components guide for implementation
2015-03-062015-04-17Report of Comments
47/2203A/CC

Compilation of comments on 47/2190/CD: IEC 62830-2 Ed.1: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting
2015-02-13yes