International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
SC 47E |
Discrete semiconductor devices |
SC 47E Subcommittee(s) and/or Working Group(s)
Label |
Title |
|---|---|
| Working Groups | |
| WG 1 | Semiconductor sensors |
| WG 2 | Microwave devices |
| WG 3 | Power devices |
| WG 4 | Optocouplers, photocoplers and solid state opto-relays |
| Maintenance Teams | |
| MT 6 | Laser diodes, LEDs, PDs and APDs |
| Joint Working Groups | |
| JWG 5 | Harmonization of the existing ISO and IEC standards dealing with laser diodes linked to ISO/TC 172/SC 9 |
| JWG 7 | Semiconductor Accelerometers |
SC 47E Membership
 Country | Country Code  | P/O Status | IEC Membership |
|---|---|---|---|
AT | P-Member | Full Member | |
BY | O-Member | Full Member | |
BE | O-Member | Full Member | |
CN | P-Member | Full Member | |
CZ | O-Member | Full Member | |
DK | O-Member | Full Member | |
FI | P-Member | Full Member | |
FR | P-Member | Full Member | |
DE | P-Member | Full Member | |
IT | P-Member | Full Member | |
JP | P-Member | Full Member | |
KR | P-Member | Full Member | |
NL | P-Member | Full Member | |
PL | O-Member | Full Member | |
RU | P-Member | Full Member | |
ES | O-Member | Full Member | |
SE | O-Member | Full Member | |
GB | P-Member | Full Member | |
US | P-Member | Full Member |
Facts and figures
Secretariat | Korea, Republic of |
|---|---|
Participating countries | 12 |
Observer Countries | 7 |
SC 47E Officers
Chairman | Mr Kuniki Ohwada (JP) Term of office : 2016-05 | |
|---|---|---|
Secretary | Mr Sang-Geun Lee (KR) | |
Assistant Secretary | Mr Hojun Ryu (KR) | |
Technical Officer | Ms Suzanne Yap Geok Sim |
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SC 47E Liaisons
Committee |
Description |
|---|---|
| Internal IEC Liaison | |
| TC 22 | Power electronic systems and equipment |
| TC 91 | Electronics assembly technology |
| TC 108 | Safety of electronic equipment within the field of audio/video, information technology and communication technology |
| Liaison ISO | |
| ISO/TC 172/SC 9 | Electro-optical systems |