International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 119

Electronique imprimée

 
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Autres Documents accessible to TC 119 depuis 2016-08-16

Référence, Titre
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Date de

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Date de

Fermeture

CENELEC

Votes /

Commentaires

47/2356/CD

[IEC 62951-2 ED1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Acceleration test for electron mobility, sub-threshold swing, and threshold voltage of flexible devices]

Titre français non disponible

2017-01-13 2017-03-10 N Report of Comments
47/2357/CD

[IEC 62951-3 ED1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging]

Titre français non disponible

2017-01-13 2017-03-10 N Report of Comments
47/2368/CD

[IEC 62951-4 ED1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for films and substrates for flexible semiconductor devices]

Titre français non disponible

2017-02-03 2017-03-31 N Report of Comments
47/2375/CD

[IEC 62951-5 ED1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials]

Titre français non disponible

2017-02-17 2017-04-14 N Report of Comments
47/2394/CC

[Compilation of Comments on 47/2356/CD - IEC 62951-2 ED1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Acceleration test for electron mobility, sub-threshold swing, and threshold voltage of flexible devices]

Titre français non disponible

2017-04-21 N
47/2396/CC

[Compilation of Comments on 47/2357/CD - IEC 62951-3 ED1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging]

Titre français non disponible

2017-04-21 N
47/2397/CDV

[IEC 62951-3 ED1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging]

Titre français non disponible

2017-06-09 2017-09-01 N
47/2398/CDV

[IEC 62951-2 ED1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Acceleration test for electron mobility, sub-threshold swing, and threshold voltage of flexible devices]

Titre français non disponible

2017-06-09 2017-09-01 N
47/2414/CC

[Compilation of Comments on 47/2368/CD - IEC 62951-4 ED1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for films and substrates for flexible semiconductor devices]

Titre français non disponible

2017-08-04 N
110/817/RR

[Review report on IEC 62715-6-1 Ed.1: Flexible display devices - Part 6-1: Mechanical stress test methods]

Titre français non disponible

2016-11-25 E
110/818/CD

[IEC 62715-6-1 ED2: Flexible display devices - Part 6-1: Mechanical test methods – Deformation tests]

Titre français non disponible

2016-12-09 2017-02-03 E Report of Comments
110/842A/CC

[Revised compilation of comments on 110/818/CD - IEC 62715-6-1 ED2: Flexible display devices - Part 6-1: Mechanical test methods – Deformation tests]

Titre français non disponible

2017-02-24 E
110/845/CDV

[IEC 62715-6-1 ED2: Flexible display devices - Part 6-1: Mechanical test methods – Deformation tests]

Titre français non disponible

2017-04-21 2017-07-14 E Voting Result
113/351/RVN

[Result of Voting on 113/312/NP - IEC TS 62607-5-2: Nanomanufacturing - Key control characteristics - Part 5-2: Thin-film organic/nano electronic devices - Measuring Alternating Current characteristics]

Titre français non disponible

2016-12-16 U
113/352/NP

[PNW TS 113-352: IEC TS 62607-5-3: Nanomanufacturing – Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration]

Titre français non disponible

2017-01-27 2017-04-21 N Voting Result
113/360/NP

[PNW TS 113-360 ED1: IEC/TS 62607-6-9: Nanomanufacturing - Key control Characteristics - Part 6-9: Graphene - Measurement of sheet resistance by the non-contact Eddy current method]

Titre français non disponible

2017-05-05 2017-07-28 N Voting Result
113/367/RVN

[Result of Voting on 113/352/NP - PNW TS 113-352: IEC TS 62607-5-3: Nanomanufacturing – Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration]

Titre français non disponible

2017-06-02 N
124/8/DC

[Review of TC 124 Strategic Business Plan (SBP)]

Titre français non disponible

2017-07-07 2017-08-18 N/A