International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 119

Printed Electronics

 
export to xls file

Other Documents accessible to TC 119 since 2016-06-25

Reference, Title
Downloads

Circulation

Date

Closing

Date

CENELEC

Voting /

Comment

47/2356/CD

IEC 62951-2 ED1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Acceleration test for electron mobility, sub-threshold swing, and threshold voltage of flexible devices

2017-01-13 2017-03-10 N Report of Comments
47/2357/CD

IEC 62951-3 ED1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging

2017-01-13 2017-03-10 N Report of Comments
47/2368/CD

IEC 62951-4 ED1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for films and substrates for flexible semiconductor devices

2017-02-03 2017-03-31 N Report of Comments
47/2375/CD

IEC 62951-5 ED1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials

2017-02-17 2017-04-14 N Report of Comments
47/2394/CC

Compilation of Comments on 47/2356/CD - IEC 62951-2 ED1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Acceleration test for electron mobility, sub-threshold swing, and threshold voltage of flexible devices

2017-04-21 N
47/2396/CC

Compilation of Comments on 47/2357/CD - IEC 62951-3 ED1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging

2017-04-21 N
47/2397/CDV

IEC 62951-3 ED1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging

2017-06-09 2017-09-01 N
47/2398/CDV

IEC 62951-2 ED1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Acceleration test for electron mobility, sub-threshold swing, and threshold voltage of flexible devices

2017-06-09 2017-09-01 N
110/817/RR

Review report on IEC 62715-6-1 Ed.1: Flexible display devices - Part 6-1: Mechanical stress test methods

2016-11-25 E
110/818/CD

IEC 62715-6-1 ED2: Flexible display devices - Part 6-1: Mechanical test methods – Deformation tests

2016-12-09 2017-02-03 E Report of Comments
110/842A/CC

Revised compilation of comments on 110/818/CD - IEC 62715-6-1 ED2: Flexible display devices - Part 6-1: Mechanical test methods – Deformation tests

2017-02-24 E
110/845/CDV

IEC 62715-6-1 ED2: Flexible display devices - Part 6-1: Mechanical test methods – Deformation tests

2017-04-21 2017-07-14 E
113/324/RVC

Result of voting on 113/295/DTS - IEC/TS 62607-6-4 Ed.1: Nanomanufacturing - Key control characteristics - Part 6-4: Graphene - Surface conductance measurement using resonant cavity

2016-07-15 N
113/351/RVN

Result of Voting on 113/312/NP - IEC TS 62607-5-2: Nanomanufacturing - Key control characteristics - Part 5-2: Thin-film organic/nano electronic devices - Measuring Alternating Current characteristics

2016-12-16 U
113/352/NP

PNW TS 113-352: IEC TS 62607-5-3: Nanomanufacturing – Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration

2017-01-27 2017-04-21 N Voting Result
113/360/NP

PNW TS 113-360 ED1: IEC/TS 62607-6-9: Nanomanufacturing - Key control Characteristics - Part 6-9: Graphene - Measurement of sheet resistance by the non-contact Eddy current method

2017-05-05 2017-07-28 N
113/367/RVN

Result of Voting on 113/352/NP - PNW TS 113-352: IEC TS 62607-5-3: Nanomanufacturing – Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration

2017-06-02 N