International Standards and Conformity Assessment for all electrical, electronic and related technologies
Nanotechnology standardization for electrical and electronic products and systems
47/2224/CDIEC 62951-1 Ed.1: Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates
|2015-01-09||2015-04-10||?||Report of Comments|
119/46/NPAt the request of the Korean NC, who originally submitted 119/46/NP, the NWIP is withdrawn and the voting process is closed. On the basis of recent findings the proposer indicated that the material presented in the NWIP is not suitable for standardization.