International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 104

Conditions, classification et essais d'environnement

 
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Autres Documents accessible to TC 104 depuis 2013-12-29

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47/2191/CD

[IEC 62880-1 Ed.1: Semiconductor devices - Wafer Level Reliability for Semiconductor Devices - Part 1: Copper Stress Migration Test Method]

Titre français non disponible
2014-01-242014-04-25yesReport of Comments
TC 91
TC 104
47/2193/CD

[IEC 60749-44 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices]

Titre français non disponible
2014-02-282014-05-30yesReport of Comments
TC 104
TC 107
91/1193/Q

[This document has been replaced by 91/1193A/Q]

Titre français non disponible
2014-07-04
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91/1193A/Q

[Questionnaire on the relevance of IEC 60068-2-77:1999 and any necessity to develop a new test method to determine dynamic mechanical shock impact]

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2014-07-112014-09-26Report of Comments
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