International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 104

Conditions, classification et essais d'environnement

 
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Autres Documents accessible to TC 104 depuis 2016-08-22

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Date de

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Date de

Fermeture

CENELEC

Votes /

Commentaires

1/2337A/DC

[Maintenance of IEC 60050-195 International Electrotechnical Vocabulary – Part 195 Earthing and protection against electric shock]

Titre français non disponible

2017-08-11 2017-11-24 N/A
35/1363A/CC

[Compilation of Comments on 35/1358/CD - IEC 60086-4/Ed5: Primary batteries - Part 4: Safety of lithium batteries]

Titre français non disponible

2017-06-30 Y
35/1379/CD

[IEC 60086-4 ED5: Primary batteries-Part 4: Safety of lithium batteries]

Titre français non disponible

2017-07-14 2017-09-08 Y
47/2314A/RVN

[Result of voting on 47/2293/NP: Future IEC XXXXX-1 Ed.1: Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 1: Classification of defects]

Titre français non disponible

2016-09-23 Y
47/2316/CDV

IEC 60749-43 Ed.1: Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 43: Directives concernant les plans de qualification de la fiabilité des CI

2016-09-09 2016-12-02 Y Voting Result
47/2331/RVC

[Result of voting on 47/2287/CDV: IEC 60749-4 Ed.2: Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)]

Titre français non disponible

2016-11-04 Y
47/2334/CD

[IEC 63068-1 Ed.1: Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxila wafer for power devices - Part 1: Classification of defects]

Titre français non disponible

2016-11-11 2017-02-03 Y Report of Comments
47/2340/RVC

[Result of Voting on 47/2281/CDV - IEC 60749-28 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level]

Titre français non disponible

2016-12-02 Y
47/2346/FDIS

[IEC 60749-4 ED2: Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp Heat, steady state, highly accelerated stress test (HAST)]

Titre français non disponible

2016-12-23 2017-02-03 Y Voting Result
47/2362/FDIS

[IEC 60749-28 ED1: Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level]

Titre français non disponible

2017-01-13 2017-02-24 Y Voting Result
47/2364/RVC

[Result of Voting on 47/2316/CDV - IEC 60749-43 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans ]

Titre français non disponible

2017-01-20 Y
47/2371/RVD

[Result of Voting on 47/2346/FDIS - IEC 60749-4 ED2: Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp Heat, steady state, highly accelerated stress test (HAST)]

Titre français non disponible

2017-02-10 Y
47/2378/CC

[Compilation of Comments on 47/2334/CD - IEC 63068-1 Ed.1: Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxila wafer for power devices - Part 1: Classification of defects]

Titre français non disponible

2017-03-03 Y
47/2379/RVD

[Result of Voting on 47/2362/FDIS - IEC 60749-28 ED1: Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level]

Titre français non disponible

2017-03-10 Y
47/2389/FDIS

IEC 60749-43 ED1: Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 43: Lignes directrices concernant les plans de qualification de la fiabilité des CI

2017-04-14 2017-05-26 Y Voting Result
47/2402/CD

[IEC 63068-1 ED1: Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 1: Classification of defects]

Titre français non disponible

2017-04-28 2017-07-21 Y Report of Comments
47/2403/RVC

[Result of Voting on 47/2296/CDV - IEC 62880-1 Ed.1: Semiconductor devices - Stress Migration Test Standard - Part 1 - Copper Stress Migration Test Standard]

Titre français non disponible

2017-04-28 Y
47/2406/RVD

[Result of Voting on 47/2389/FDIS - IEC 60749-43 ED1: Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans]

Titre français non disponible

2017-06-02 Y
47/2407/FDIS

[IEC 62880-1 ED1: Semiconductor devices - Stress migration test standard - Part 1: Copper stress migration test standard]

Titre français non disponible

2017-06-16 2017-07-28 Y Voting Result
47/2416/RVD

[Result of Voting on 47/2407/FDIS - IEC 62880-1 ED1: Semiconductor devices - Stress migration test standard - Part 1: Copper stress migration test standard]

Titre français non disponible

2017-08-04 Y
89/1356/RVN

[Result of Voting on 89/1333/NP - IEC 60695-2-20-TS/Ed3: Fire hazard testing - Part 2-20: Glowing/hot-wire based test methods - Hot wire ignition test - Apparatus, confirmatory test arrangement and guidance]

Titre français non disponible

2017-01-27 N
89/1358/CC

[Compilation of Comments on 89/1325/CD - IEC 60695-6-2/Ed2: Fire hazard testing - Part 6-2: Smoke obscuration - Summary and relevance of test methods]

Titre français non disponible

2017-01-27 Y
89/1360/CDV

[IEC 60695-6-2 ED2: Fire hazard testing - Part 6-2: Smoke obscuration - Summary and relevance of test methods]

Titre français non disponible

2017-03-31 2017-06-23 Y Voting Result
89/1362/RVN

[Result of Voting on 89/1317/NP - IEC TS 60695-2-14/Ed1: Fire hazard testing - Part 2-14: Glowing/hot-wire based test methods - Glow-wire ignition temperature test method for end products (GWITEP)]

Titre français non disponible

2017-02-10 N
89/1363/RVDTS

[Result of Voting on 89/1334/DTS - IEC 60695-1-14-TS/Ed1: Fire hazard testing - Part 1-14: Guidance on the different levels of power and energy related to the probability of ignition and fire in low voltage electrotechnical products]

Titre français non disponible

2017-06-09 N
89/1367/CD

[IEC TS 60695-2-14/Ed1: Fire hazard testing - Part 2-14: Glowing/hot-wire based test methods - Glow-wire ignition temperature test method for end products (GWITEP)]

Titre français non disponible

2017-07-21 2017-09-15 N