International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 104

Environmental conditions, classification and methods of test

 
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47/2191/CD

IEC 62880-1 Ed.1: Semiconductor devices - Wafer Level Reliability for Semiconductor Devices - Part 1: Copper Stress Migration Test Method
2014-01-242014-04-25?
TC 91
TC 104
47/2193/CD

IEC 60749-44 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
2014-02-282014-05-30?
TC 104
TC 107