International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 107

Gestion des processus pour avionique

 
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Autres Documents accessible to TC 107 depuis 2013-04-17

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47/2169/CD

[IEC 60749- 43 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plan]

Titre français non disponible
2013-05-242013-07-26?Report of Comments
TC 56
TC 91
TC 107
47/2172/CD

[IEC 62435-1 Ed.1: Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General]

Titre français non disponible
2013-06-142013-09-20?Report of Comments
TC 56
TC 107
47/2173/CD

[IEC 62435-2 Ed.1: Electronic components - Long-term storage of electronic semiconductor devices - Part 2 - Deterioration Mechanisms]

Titre français non disponible
2013-06-142013-09-20?Report of Comments
TC 56
TC 107
47/2174/CD

[IEC 62435-5 Ed.1: Electronic components - Long-term storage of electronic semiconductor devices - Part 5 - Die & Wafer Devices]

Titre français non disponible
2013-06-142013-09-20?Report of Comments
TC 56
TC 107
47/2193/CD

[IEC 60749-44 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices]

Titre français non disponible
2014-02-282014-05-30?
TC 104
TC 107
56/1547/DC

[Proposal from the UKNC to revise IEC 62402: 2007 Obsolescence management - Application guide.]

Titre français non disponible
2014-01-172014-02-28Report of Comments
TC 21
TC 35
TC 40
TC 46
TC 47
TC 48
TC 49
TC 51
TC 107