International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 107

Gestion des processus pour avionique

 
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Autres Documents accessible to TC 107 depuis 2013-07-29

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47/2193/CD

[IEC 60749-44 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices]

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2014-02-282014-05-30?Report of Comments
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56/1547/DC

[Proposal from the UKNC to revise IEC 62402: 2007 Obsolescence management - Application guide.]

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2014-01-172014-02-28Report of Comments
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91/1193/Q

[This document has been replaced by 91/1193A/Q]

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2014-07-04
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91/1193A/Q

[Questionnaire on the relevance of IEC 60068-2-77:1999 and any necessity to develop a new test method to determine dynamic mechanical shock impact]

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2014-07-112014-09-26
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